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ABSTRACT SHAPE OF A TEST PIN

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REGISTERED

on 19 Jan 2024

Last Applicant/ Owned by

JOHNSTECH INTERNATIONAL CORPORATION

1210 New Brighton BoulevardMinneapolis MN 55413

Serial Number

2146555 filed on 28^th Sept 2021

Registration Number

TMA1219150 registered on 19^th Jan 2024

Registration expiry Date

28^th Sept 2031

Correspondent Address

MARKS & CLERK

33 Yonge Street, Suite 300Toronto

ONTARIO

M5E1G4

ABSTRACT SHAPE OF A TEST PIN

Trademark usage description

test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit tes Read More

Vienna Information

26 . 13 . 25

Other geometrical figures, indefinable designs -- Note: Including scratch marks.Autres figures géométriques, dessins indéfinissables -- Note: Y compris les marques de griffes.

Classification Information

Class [009]
Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester; probes for testing semiconductors.

Classification kind code

Class [042]
Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips.

Classification kind code

Mark Details

Serial Number

2146555

Mark Type

Trademark

Legal History

Action Taken	Status
Submitted for opposition 22 on 10^th Mar 2023	Search Recorded
Submitted for opposition 20 on 10^th Mar 2023	Examiner's First Report
Submitted for opposition 223 on 10^th Mar 2023	Total Provisional Refusal
Submitted for opposition 256 on 12^th Sept 2022	Notification of Possible Opposition Sent
Submitted for opposition 48 on 9^th Jun 2022	Agent Changed
Submitted for opposition 257 on 11^th Nov 2021	Designation Notification - Madrid Protocol
Submitted for opposition 1 on 10^th Nov 2021	Created
Submitted for opposition 31 on 10^th Nov 2021	Formalized
Submitted for opposition 30 on 28^th Sept 2021	Filed
Submitted for opposition 228 on 28^th Sept 2021	International Registration

ABSTRACT SHAPE OF A TEST PIN

Classification Information

Class [009]Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester; probes for testing semiconductors.

Classification kind code

Classification kind code

Mark Details

Serial Number

Mark Type

Legal History

Class [009]
Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester; probes for testing semiconductors.