Trademark Search in Canada

DAISHO

View On IC.GC.CA

REGISTERED

on 28 Jun 2024

Last Applicant/ Owned by

JOHNSTECH INTERNATIONAL CORPORATION

1210 New Brighton BoulevardMinneapolis MN 55413

Serial Number

2173342 filed on 1^st Feb 2022

Registration Number

TMA1241141 registered on 28^th Jun 2024

Registration expiry Date

1^st Feb 2032

Correspondent Address

MARKS & CLERK

33 Yonge Street, Suite 300Toronto

ONTARIO

M5E1G4

DAISHO

Trademark usage description

test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers; probes for testing semicon Read More

Classification Information

Class [009]
Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers; probes for testing semiconductors.

Classification kind code

Mark Details

Serial Number

2173342

Mark Type

Trademark

Legal History

Action Taken	Status
Submitted for opposition 22 on 23^rd Jun 2023	Search Recorded
Submitted for opposition 20 on 23^rd Jun 2023	Examiner's First Report
Submitted for opposition 223 on 23^rd Jun 2023	Total Provisional Refusal
Submitted for opposition 256 on 17^th Jan 2023	Notification of Possible Opposition Sent
Submitted for opposition 48 on 9^th Jun 2022	Agent Changed
Submitted for opposition 257 on 17^th Mar 2022	Designation Notification - Madrid Protocol
Submitted for opposition 1 on 16^th Mar 2022	Created
Submitted for opposition 31 on 16^th Mar 2022	Formalized
Submitted for opposition 30 on 1^st Feb 2022	Filed
Submitted for opposition 228 on 1^st Feb 2022	International Registration

DAISHO

Classification Information

Class [009]Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers; probes for testing semiconductors.

Classification kind code

Mark Details

Serial Number

Mark Type

Legal History

Class [009]
Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers; probes for testing semiconductors.