MQ GARNET

Trademark usage description

laser ellipsometry metrology apparatus used in silicon and/or compound semiconductor industry; x-ray fluorescence disc and wafer analysers/testers.

Classification Information

CIPO Classification Code

Nice

1149075

Trademark

Action Taken	Status
Submitted for opposition 50 on 23^rd Jan 2004	Allowed
Submitted for opposition 51 on 23^rd Jan 2004	Allowance Notice Sent
Submitted for opposition 42 on 5^th Nov 2003	Advertised
Submitted for opposition 15 on 31^st Oct 2003	Correspondence Created
Submitted for opposition 26 on 30^th Sept 2003	Approved
Submitted for opposition 22 on 9^th May 2003	Search Recorded
Submitted for opposition 20 on 9^th May 2003	Examiner's First Report
Submitted for opposition 31 on 29^th Aug 2002	Formalized
Submitted for opposition 1 on 12^th Aug 2002	Created
Submitted for opposition 30 on 7^th Aug 2002	Filed