VERTEX

Trademark usage description

optical inspection system for inspection and measurement of semiconductor wafers and similar substrates in various stages of processing comprised of a Read More

Classification Information

Class [009]
Electrical, scientific and teaching apparatus and software

Comment text

CIPO Classification Code

Classification kind code

Nice

Mark Details

Serial Number

1540036

Mark Type

Trademark

Legal History

Action Taken	Status
Submitted for opposition 6 on 4^th Dec 2012	Abandoned - Section 36
Submitted for opposition 14 on 11^th Sept 2012	Default Notice Sent
Submitted for opposition 20 on 23^rd Feb 2012	Examiner's First Report
Submitted for opposition 22 on 8^th Feb 2012	Search Recorded
Submitted for opposition 31 on 26^th Aug 2011	Formalized
Submitted for opposition 1 on 18^th Aug 2011	Created
Submitted for opposition 30 on 17^th Aug 2011	Filed